Surface Analysis Chemistry
High-resolution XPS, Auger electron spectroscopy, and thin-film depth profiling for oxidation state mapping, contamination detection, and passivation layer integrity on corrosive-resistant metal alloys.
Identify trace contaminants and oxide layers on stainless steel and nickel alloys with sub-nanometer depth resolution using monochromatic Al Kα X-rays.
Oxidation state mappingLayer-by-layer elemental composition of thin-film coatings on corrosion-resistant alloys with 2 nm depth resolution, revealing interdiffusion zones and interface chemistry.
Nanometer-scale profilingQuantitative evaluation of oxide film stability on aluminum, titanium, and nickel-based alloys using angle-resolved XPS and ion scattering spectroscopy.
Corrosion resistance predictionDetermine coating thickness, stoichiometry, and defect density across large-area samples for quality control of protective layers in aerospace components.
Coating quality assuranceResolve Cr³⁺/Cr⁶⁺, Fe²⁺/Fe³⁺, and Ni²⁺/Ni⁰ ratios in passivation layers to assess corrosion initiation sites and guide surface treatment protocols.
Chemical state quantificationEach package is designed for a specific analytical need — from routine contamination checks to full-depth profiling of protective coatings. Choose the scope that matches your material qualification or R&D stage.
Not sure which package fits your sample? We can help match the right method to your alloy and surface condition.
Discuss your analysis needsMonochromated Al Kα survey plus high-resolution core-level scans of Fe 2p, Cr 2p, Ni 2p, O 1s, and C 1s. Includes quantification of oxide states and trace elements on stainless steel and nickel alloys. Delivered with peak-fit tables and atomic concentration report.
Focused electron beam combined with Ar⁺ sputtering to resolve elemental composition vs. depth for up to 10 layers. Depth resolution ≤2 nm. Includes interface width measurement, diffusion zone analysis, and coating thickness calibration.
Angle-resolved XPS and low-energy ion scattering to determine oxide film stoichiometry, thickness (1–20 nm), and hydroxide/oxide ratio on Al, Ti, Ni-based alloys. Maps Cr enrichment in stainless steels and identifies breakdown precursors.
Combine XPS, AES, and ISS in a single workflow for correlative analysis of oxidation states, elemental depth distribution, and outermost monolayer composition. Ideal for failure analysis and process validation on complex alloy surfaces.
Explore complementary techniques for a complete understanding of your alloy’s surface chemistry and corrosion resistance.
High-resolution survey of oxidation states on stainless steel. Identify trace contaminants and oxide layers with sub-nanometer depth resolution using monochromatic Al Kα X-rays.
View service detailsLayer-by-layer elemental composition of thin-film coatings. Resolve interdiffusion zones and coating thickness uniformity with 2 nm depth resolution for protective coatings.
View service detailsQuantitative evaluation of oxide film stability on metal alloys. Determine stoichiometry and predict corrosion initiation sites using angle-resolved XPS and ion scattering spectroscopy.
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